This course is part of Semiconductor Characterization.
This course cannot be purchased separately - to access the complete learning experience, graded assignments, and earn certificates, you'll need to enroll in the full Semiconductor Characterization Specialization program. You can audit this specific course for free to explore the content, which includes access to course materials and lectures. This allows you to learn at your own pace without any financial commitment.
Instructors:
English
What you'll learn
Define resistance, resistivity, and sheet resistance with proper units
Master four-point probe current-voltage measurement techniques
Understand and apply the transfer length method
Analyze diode characteristics and extract key parameters
Implement process monitor blocks for manufacturing control
Skills you'll gain
This course includes:
1.7 Hours PreRecorded video
6 quizzes
Access on Mobile, Tablet, Desktop
FullTime access
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There are 6 modules in this course
This course provides a comprehensive study of electrical characterization techniques for semiconductor devices, specifically focusing on diodes. Students learn fundamental concepts of resistivity and sheet resistance measurements, four-point probe techniques, and transfer length methods for contact resistance determination. The curriculum covers current-voltage (IV) measurements of p-n junction diodes, extraction of key device parameters, and practical applications in process monitoring for semiconductor manufacturing.
Course Introduction
Module 1 · 17 Minutes to complete
Resistivity and Sheet Resistance
Module 2 · 42 Minutes to complete
Resistance Measurements and Four-point Probes
Module 3 · 56 Minutes to complete
Measuring Contact Resistance
Module 4 · 51 Minutes to complete
The Current-voltage (IV) Characteristics of Diodes
Module 5 · 36 Minutes to complete
Course Wrap-up and Project
Module 6 · 43 Minutes to complete
Fee Structure
Individual course purchase is not available - to enroll in this course with a certificate, you need to purchase the complete Professional Certificate Course. For enrollment and detailed fee structure, visit the following: Semiconductor Characterization
Instructor
Professor of Electrical Engineering at Arizona State University
Dr. Trevor Thornton is a professor in the Ira A. Fulton Schools of Engineering at Arizona State University (ASU), specializing in electrical engineering. He holds a Ph.D. in Physics from Cambridge University and has an extensive academic and industrial background, having published over 150 journal and conference papers and holding seven patents. Dr. Thornton is the founder of RF Micropower, a company focused on commercializing efficient RF and power management integrated circuits based on silicon-on-insulator (SOI) MESFET technology.His research interests encompass a wide range of topics, including silicon-on-insulator MESFETs, electronics for extreme environments, electron transport in nanostructures, and bio-molecular sensors. Before joining ASU in 1998, he held post-doctoral positions at the Cavendish Laboratory in Cambridge and Bell Communications Research in New Jersey, and he was a lecturer at Imperial College London.
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