Transmission Electron Microscopy for Materials Science
Explore advanced electron microscopy techniques for analyzing material structures while mastering transmission electron microscopy fundamentals.
Explore advanced electron microscopy techniques for analyzing material structures while mastering transmission electron microscopy fundamentals.
Dive deep into the world of Transmission Electron Microscopy (TEM) for materials science applications. This comprehensive course covers the theoretical foundations of TEM, from basic principles to advanced techniques. Learn about electron-matter interactions, diffraction theory, imaging modes, and data interpretation. Explore topics such as lens aberrations, reciprocal lattice concepts, dynamical scattering effects, and phase contrast imaging. Gain the knowledge to understand TEM data in scientific papers and prepare for hands-on instrument training. Ideal for materials scientists, physicists, and engineers seeking to leverage TEM for nanoscale material characterization.
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What you'll learn
Understand the fundamental principles of transmission electron microscopy
Analyze electron diffraction patterns and interpret crystallographic information
Explain the effects of lens aberrations and dynamical scattering on TEM images
Apply the concepts of reciprocal lattice and Ewald sphere to diffraction analysis
Interpret phase contrast images and understand the contrast transfer function
Evaluate the applicability of different TEM techniques for specific materials science problems
Skills you'll gain
This course includes:
5.4 Hours PreRecorded video
29 assignments
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There are 8 modules in this course
This course provides a comprehensive introduction to Transmission Electron Microscopy (TEM) for materials science applications. Students will gain a deep understanding of the theoretical principles underlying TEM operation and data interpretation. The curriculum covers essential topics such as electron optics, diffraction theory, imaging modes, and advanced techniques like phase contrast imaging. Learners will explore the physics of electron-matter interactions, dynamical scattering effects, and the interpretation of diffraction patterns and high-resolution images. The course emphasizes the connection between TEM techniques and materials properties, enabling students to select appropriate methods for specific scientific problems. Through a combination of lectures, exercises, and practical examples, participants will develop the skills to critically analyze TEM data and prepare for hands-on instrument training.
Introduction
Module 1 · 5 Hours to complete
Introduction (II)
Module 2 · 4 Hours to complete
Diffraction basics (I): Ewald sphere / Reciprocal lattice
Module 3 · 5 Hours to complete
Diffraction basics (II): Multi-beam / Kinematical scattering
Module 4 · 6 Hours to complete
Diffraction and imaging: Dynamical effects (II)
Module 6 · 5 Hours to complete
Phase contrast (I)
Module 7 · 5 Hours to complete
Phase contrast (II)
Module 8 · 5 Hours to complete
Fee Structure
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Instructors
Associate Professor, Electron Spectrometry and Microscopy Laboratory
Cécile Hébert is professor for Physics at the Institute for Condensed Matter Physics at EPFL and head of the Interdisciplinary Center for Electron Microscopy (CIME), which features cutting edge microscopy both in the field of life and materials sciences. Her research activities cover Electron Energy Loss Spectrometry in the TEM, for chemical analysis, energy filtered TEM, as well as three-dimensional analysis of defects and dislocations in TEM and STEM.
Senior Scientific Collaborator
Dr Duncan Alexander is a staff scientist and senior microscopist at the Interdisciplinary Centre for Electron Microscopy (CIME) at the EPFL. Inspired by the incredible scientific versatility of advanced transmission electron microscopy (TEM), combined with the uniquely aesthetic nature of TEM imaging, he specializes in the application of TEM techniques for solving questions across a multi-disciplinary array of domains. With particular interests in TEM spectral and diffraction mapping, and aberration corrected imaging, he has published in research fields from materials science and metallurgy to nanophotonics and atmospheric sciences.
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