TEM for Materials Science: Fundamentals and Applications
Master transmission electron microscopy techniques for advanced materials analysis and characterization.
Master transmission electron microscopy techniques for advanced materials analysis and characterization.
Dive into the world of transmission electron microscopy (TEM) with this comprehensive course designed for materials scientists. Gain a deep understanding of modern TEM techniques, from basic principles to advanced applications. Learn how TEM provides unparalleled insights into material structures from the micrometer to sub-angstrom scale. Explore the connections between instrument optics, electron-matter interactions, and material properties. By the end of the course, you'll be equipped to interpret TEM data in scientific papers and select appropriate TEM techniques for specific research problems. This course serves as an excellent foundation for practical TEM training and advanced techniques in materials science.
Instructors:
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What you'll learn
Understand the fundamental principles of transmission electron microscopy
Analyze diffraction patterns and interpret crystallographic information
Explain electron-matter interactions and their impact on image formation
Interpret TEM data presented in scientific papers with confidence
Select appropriate TEM techniques for specific materials science problems
Appreciate technological advances in TEM, such as aberration correction
Skills you'll gain
This course includes:
PreRecorded video
Graded assignments, exams
Access on Mobile, Tablet, Desktop
Limited Access access
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There are 8 modules in this course
This course offers a comprehensive introduction to transmission electron microscopy (TEM) in materials science. Students will gain in-depth knowledge of modern TEM techniques, understanding the intricate relationships between instrument optics, electron-matter interactions, and material properties. The curriculum covers a wide range of topics, including diffraction basics, dynamical effects in diffraction and imaging, and phase contrast. Participants will learn to analyze crystallinity, grain structure, defects, and chemical composition at various scales. The course emphasizes the versatility of TEM as an analytical platform, highlighting its unique ability to provide direct structural analysis of nanoparticles and atomic-resolution imaging of crystal lattices. By the end of the course, students will be able to interpret TEM data in scientific literature, select appropriate TEM techniques for specific research problems, and appreciate recent technological advances in the field, such as aberration correction for sub-angstrom resolution.
Introduction (I)
Module 1
Introduction (II)
Module 2
Diffraction basics (I) - Ewald sphere, reciprocal lattice
Module 3
Diffraction basics (II) - multi-beam, kinematical scattering
Module 4
Diffraction and imaging - dynamical effects (I)
Module 5
Diffraction and imaging - dynamical effects (II)
Module 6
Phase contrast (I)
Module 7
Phase contrast (II)
Module 8
Fee Structure
Instructors
Associate Professor, Electron Spectrometry and Microscopy Laboratory
Cécile Hébert is professor for Physics at the Institute for Condensed Matter Physics at EPFL and head of the Interdisciplinary Center for Electron Microscopy (CIME), which features cutting edge microscopy both in the field of life and materials sciences. Her research activities cover Electron Energy Loss Spectrometry in the TEM, for chemical analysis, energy filtered TEM, as well as three-dimensional analysis of defects and dislocations in TEM and STEM.
Senior Scientific Collaborator
Dr Duncan Alexander is a staff scientist and senior microscopist at the Interdisciplinary Centre for Electron Microscopy (CIME) at the EPFL. Inspired by the incredible scientific versatility of advanced transmission electron microscopy (TEM), combined with the uniquely aesthetic nature of TEM imaging, he specializes in the application of TEM techniques for solving questions across a multi-disciplinary array of domains. With particular interests in TEM spectral and diffraction mapping, and aberration corrected imaging, he has published in research fields from materials science and metallurgy to nanophotonics and atmospheric sciences.
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