Electron and Ion Beam Characterization
This course is part of Semiconductor Characterization.
This course cannot be purchased separately - to access the complete learning experience, graded assignments, and earn certificates, you'll need to enroll in the full Semiconductor Characterization Specialization program. You can audit this specific course for free to explore the content, which includes access to course materials and lectures. This allows you to learn at your own pace without any financial commitment.
Instructors:
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What you'll learn
Understand electron and ion beam interactions with semiconductor materials
Master scanning electron microscopy techniques and applications
Analyze surface composition using Auger electron spectroscopy
Perform quantitative analysis using secondary ion mass spectroscopy
Apply beam characterization techniques to real-world semiconductor devices
Skills you'll gain
This course includes:
1.4 Hours PreRecorded video
4 quizzes, 1 assignment
Access on Mobile, Tablet, Desktop
FullTime access
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There are 5 modules in this course
This comprehensive course covers fundamental principles and applications of electron and ion beam characterization techniques for semiconductor materials and devices. Students learn about scanning electron microscopy (SEM), Auger electron spectroscopy (AES), and secondary ion mass spectroscopy (SIMS). The curriculum includes practical applications through case studies and projects, including quantitative surface analysis of solar cells using SEM imaging.
Course Introduction
Module 1 · 9 Minutes to complete
Week 4.1: Scanning Electron Microscopy
Module 2 · 1 Hours to complete
Week 4.2: Auger Electron Spectroscopy
Module 3 · 58 Minutes to complete
Week 4.3: Secondary Ion Mass Spectroscopy
Module 4 · 45 Minutes to complete
Week 4.4: Course Wrap-up and Project
Module 5 · 1 Hours to complete
Fee Structure
Individual course purchase is not available - to enroll in this course with a certificate, you need to purchase the complete Professional Certificate Course. For enrollment and detailed fee structure, visit the following: Semiconductor Characterization
Instructor
Professor of Electrical Engineering at Arizona State University
Dr. Trevor Thornton is a professor in the Ira A. Fulton Schools of Engineering at Arizona State University (ASU), specializing in electrical engineering. He holds a Ph.D. in Physics from Cambridge University and has an extensive academic and industrial background, having published over 150 journal and conference papers and holding seven patents. Dr. Thornton is the founder of RF Micropower, a company focused on commercializing efficient RF and power management integrated circuits based on silicon-on-insulator (SOI) MESFET technology.His research interests encompass a wide range of topics, including silicon-on-insulator MESFETs, electronics for extreme environments, electron transport in nanostructures, and bio-molecular sensors. Before joining ASU in 1998, he held post-doctoral positions at the Cavendish Laboratory in Cambridge and Bell Communications Research in New Jersey, and he was a lecturer at Imperial College London.
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