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Electron and Ion Beam Characterization
This course is part of Semiconductor Characterization.
Course Cost
Free course
Intermediate
Skill Level
4 Hours
Self-paced lessons
This course cannot be purchased separately - to access the complete learning experience, graded assignments, and earn certificates, you'll need to enroll in the full Semiconductor Characterization Specialization program. You can audit this specific course for free to explore the content, which includes access to course materials and lectures. This allows you to learn at your own pace without any financial commitment.
English
What you'll learn
Understand electron and ion beam interactions with semiconductor materials
Master scanning electron microscopy techniques and applications
Analyze surface composition using Auger electron spectroscopy
Perform quantitative analysis using secondary ion mass spectroscopy
Apply beam characterization techniques to real-world semiconductor devices
Skills you'll gain
This course includes:
1.4 Hours PreRecorded video
4 quizzes, 1 assignment
Access on Mobile, Tablet, Desktop
FullTime access
Shareable certificate
Get a Completion Certificate
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Get a Completion Certificate
Share your certificate with prospective employers and your professional network on LinkedIn.
CREATED BY
PROVIDED BY
Top companies offer this course to their employees
Top companies provide this course to enhance their employees' skills, ensuring they excel in handling complex projects and drive organizational success.
There are 5 modules in this course
This comprehensive course covers fundamental principles and applications of electron and ion beam characterization techniques for semiconductor materials and devices. Students learn about scanning electron microscopy (SEM), Auger electron spectroscopy (AES), and secondary ion mass spectroscopy (SIMS). The curriculum includes practical applications through case studies and projects, including quantitative surface analysis of solar cells using SEM imaging.
Course Introduction
Module 1 · 9 Minutes to complete
Week 4.1: Scanning Electron Microscopy
Module 2 · 1 Hours to complete
Week 4.2: Auger Electron Spectroscopy
Module 3 · 58 Minutes to complete
Week 4.3: Secondary Ion Mass Spectroscopy
Module 4 · 45 Minutes to complete
Week 4.4: Course Wrap-up and Project
Module 5 · 1 Hours to complete
Fee Structure
Individual course purchase is not available - to enroll in this course with a certificate, you need to purchase the complete Professional Certificate Course. For enrollment and detailed fee structure, visit the following: Semiconductor Characterization
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Faculties
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Frequently asked Questions
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